EXTENDED SOURCE WAVEFRONT SENSOR THROUGH OPTICAL CORRELATION WITH A CHANGE IN CENTROID POSITION OF LIGHT CORRESPONDING TO A MAGNITUDE OF TIP/TILT ABERRATION OF OPTICAL JITTER (AS AMENDED)

Patent №

US 8,907,260

Granted

2014-12-09

Filed 2012

Owner

NAVY, GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF, THE

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13482304

An atmospheric aberration sensor that uses two optically correlated images of a scene and the Fourier transform capabilities of a lens or other focusing element. The sensor receives light via an f-number matching element from a scene or from an external optical system and transmits it through a focusing optical element to an updateable display element such as a spatial light modulator or micro mirror array, which modulates the real time image from the focusing element with previous template image of the same extended scene. The modulated image is focused onto an autocorrelation detection sensor, which detects a change in centroid position corresponding to a change of the tip/tilt in the optical path. This peak shift is detected by centroid detection and corresponds to the magnitude of global wavefront tip/tilt. With a lenslet array and detector array, the system can also measure local tip/tilt and higher order aberrations.

VisionG01J 9/00G02B 26/06G06V 10/89

AI classification

Vision1.00
AI hardware0.20
Knowledge representation0.07
Machine learning0.00
Planning0.00
Natural language0.00
Evolutionary computation0.00
Speech0.00

Ownership

NAVY, GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF, THE

assignment · 283150089

Assignors

RESTAINO, SERGIO R., ANDREWS, JONATHAN

On an employer assignment, the assignors are typically the inventors.

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