CHARGED-PARTICLE MICROSCOPE AND METHOD FOR CONTROLLING SAME

Patent №

US 8,934,006

Granted

2015-01-13

Filed 2012

Owner

HITACHI HIGH-TECHNOLOGIES CORPORATION

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13511810

The present invention provides an intuitive and easy-to-operate graphical user interface environment for charged-particle microscopes.By restricting the operation items of charged-particle microscopes to the control button operations on GUI screen, excluding the charged-particle microscope specific technical terms, and unifying the observation conditions in the simple terminology with which the observation object can be intuitively understood, the operation environment which is intuitive and easy to understand for users not caring charged-particle microscopes is realized, and by restricting each of electron optical conditions in conjunction with the change of the observation condition to the fixed values and tabling them, it is possible to omit the operation workload of the user.

VisionH01J 37/265H01J 37/22H01J 37/26

AI classification

Vision0.66
AI hardware0.15
Natural language0.00
Machine learning0.00
Planning0.00
Knowledge representation0.00
Speech0.00
Evolutionary computation0.00

Ownership

HITACHI HIGH-TECHNOLOGIES CORPORATION

assignment · 282650522

Assignors

CHINO, HAJIME, WATAHIKI, MASARU, IWAYA, TORU

On an employer assignment, the assignors are typically the inventors.

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