METHOD AND APPARATUS FOR DETECTING SURFACE UNEVENNESS OF OBJECT UNDER INSPECTION

Patent №

US 8,948,491

Granted

2015-02-03

Filed 2011

Owner

KABUSHIKI KAISHA BRIDGESTONE

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13060551

Minute surface unevenness formed on the surface of an object under inspection is detected, thereby improving the accuracy of an appearance inspection. A target surface in the sidewall region (21) of a tire (20) is illuminated by a red slit light from a first illuminating means (11) disposed in the direction of 45 degrees with respect to the normal line to the target surface. At the same time, the target surface is illuminated by a blue slit light from a second illuminating means (12) disposed in the direction of −45 degrees with respect to the normal line. The illuminated surface is shot by a line camera (13) from the direction of the normal line. An R-component image and a B-component image are produced from the original image, and their respective luminance distribution waveforms are obtained. The surface unevenness formed on the target surface is detected on the basis of the luminance distribution waveforms.

VisionG01B 11/30G01N 21/8806G01N 21/8851G01N 21/95G01N 21/952G01M 17/027

AI classification

Vision1.00
Natural language0.01
Evolutionary computation0.00
AI hardware0.00
Knowledge representation0.00
Machine learning0.00
Planning0.00
Speech0.00

Ownership

KABUSHIKI KAISHA BRIDGESTONE

assignment · 260320481

Assignors

SEKIGUCHI, TOSHIKATSU

On an employer assignment, the assignors are typically the inventors.

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