AUTOMATED SAMPLE TEST SYSTEM, AND METHOD FOR CONTROLLING SAME

Patent №

US 8,972,044

Granted

2015-03-03

Filed 2013

Owner

HITACHI HIGH-TECHNOLOGIES CORPORATION

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13816897

A method for controlling an automated sample test system includes a samples conveyance line for conveying samples racks, each holding samples, to a plurality of processing units, and an empty-rack stock section in which to stock samples racks not holding a sample. The control method is designed to collect information on whether the processing units are in need of a supply of empty samples racks, and then supply empty samples racks from the empty-rack stock section to the processing units based on the information. Decreases in throughput can be prevented by leveling the number of empty samples racks supplied to the processing units that require empty samples racks.

PlanningG01N 35/04G01N 35/0092G01N 35/026G01N 2035/0094Y10T 436/113332Y10T 436/25

AI classification

Planning0.97
Evolutionary computation0.04
Vision0.01
Natural language0.00
Knowledge representation0.00
AI hardware0.00
Speech0.00
Machine learning0.00

Ownership

HITACHI HIGH-TECHNOLOGIES CORPORATION

assignment · 299040397

Assignors

SUZUKI, ATSUSHI, KAMOSHIDA, KOJI, AKUTSU, MASASHI, TAKAHASHI, KENICHI, OHGA, HIROSHI

On an employer assignment, the assignors are typically the inventors.

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