APPARATUS AND METHOD FOR DETECTING ERROR IN LESION CONTOUR, APPARATUS AND METHOD FOR CORRECTING ERROR IN LESION CONTOUR, AND APPARATUS FOR INSPECTING ERROR IN LESION CONTOUR

Patent №

US 8,977,052

Granted

2015-03-10

Filed 2012

Owner

SAMSUNG ELECTRONICS CO., LTD.

Lab

AI components

3

vision · kr · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13668068

An apparatus for detecting an error in a contour of a lesion includes an extracting unit configured to extract a contour of a lesion in each of a plurality of two-dimensional image frames that form a three-dimensional image, and an error determining unit configured to determine a presence or an absence of an error in a contour of a lesion in a target image frame of the two-dimensional image frames based on estimation information about the lesion in the target image frame and/or an energy value that corresponds to the contour of the lesion in the target image frame.

VisionKnowledge representationAI hardwareG06T 7/0016G06T 7/0012G06T 7/11G06T 7/174G06T 2207/10072G06T 2207/30068G06T 2207/30096

AI classification

Vision1.00
AI hardware0.70
Knowledge representation0.54
Machine learning0.01
Natural language0.00
Evolutionary computation0.00
Speech0.00
Planning0.00

Ownership

SAMSUNG ELECTRONICS CO., LTD.

assignment · 292360298

Assignors

CHANG, CHU-HO, SEONG, YEONG-KYEONG, PARK, MOON-HO

On an employer assignment, the assignors are typically the inventors.

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