Patent №
US 9,109,901
Granted
2015-08-18
Filed 2013
Owner
FREESCALE SEMICONDUCTOR, INC.
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
13790717
Systems and methods are provided for monitoring operation of MEMS gyroscopes (110). A test signal generator (124) is configured to generate and apply a test signal to the rate feedback loop (112) of a MEMS gyroscope (110). A test signal detector (126) is coupled to the quadrature feedback loop (114) of the MEMS gyroscope (110) and is configured to receive a quadrature output signal from the quadrature feedback loop (114). The test signal detector (126) demodulates the quadrature output signal to detect effects of the test signal. Finally, the test signal detector (126) is configured to generate a monitor output indicative of the operation of the sensing device based at least in part on the detected effects of the test signal in the quadrature output signal. Thus, the system is able to provide for the continuous monitoring of the operation of the MEMS gyroscope (110).
AI classification
Ownership
FREESCALE SEMICONDUCTOR, INC.
assignment · 300040575
Assignors
FANG, DEYOU, KRAVER, KEITH L., SCHLARMANN, MARK E.
On an employer assignment, the assignors are typically the inventors.