IMAGE SENSOR DEFECT IDENTIFICATION USING BLURRING TECHNIQUES

Patent №

US 9,232,121

Granted

2016-01-05

Filed 2013

Owner

MICRON TECHNOLOGY, INC.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

14036939

Embodiments described herein may operate to image a scene with an imaging system using an image blurring technique. An image sensor array (ISA) element may be identified as a dark defect element if a first ratio of an average of a set of illuminance signal magnitudes from a set of surrounding ISA elements to a magnitude of an illuminance signal from the ISA element is greater than a threshold sharpness value. The image sensor array element may be identified as a bright defect element if a second ratio of the magnitude of the illuminance signal from the ISA element to the average of the set of illuminance signal magnitudes from the set of surrounding ISA elements is greater than the threshold sharpness value.

VisionH04N 17/002H04N 25/63H04N 25/68H04N 25/683

AI classification

Vision1.00
AI hardware0.08
Planning0.03
Machine learning0.00
Speech0.00
Natural language0.00
Evolutionary computation0.00
Knowledge representation0.00

Ownership

MICRON TECHNOLOGY, INC.

assignment · 326270395

Assignors

OVSIANNIKOV, ILIA

On an employer assignment, the assignors are typically the inventors.

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