METHOD OF, AND APPARATUS FOR, ADAPTIVE SAMPLING

Patent №

US 9,306,828

Granted

2016-04-05

Filed 2013

Owner

XYRATEX TECHNOLOGY LIMITED

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13941220

A method of sampling sensor data from a computing system is presented. The computing system includes a plurality of components and a sensor network for monitoring the computing system. The sensor network includes primary sensor nodes operable to obtain primary parameter data from a measurement of a primary parameter of the components, and secondary sensor nodes operable to obtain secondary parameter data from a measurement of secondary parameters of the components. The method includes: a) obtaining secondary parameter data from secondary sensor nodes relating to components; b) processing, in a computing device, the secondary parameter data; c) determining, based upon determined or pre-determined relationships between the secondary parameters and the primary parameter, a sample rate for the primary parameter data for the components; and d) obtaining primary parameter data from the primary sensor nodes relating to components at the determined sample rate.

PlanningH04L 43/103G06F 11/0727G06F 11/0766G06F 11/30G06F 11/3034G06F 11/3058G06F 11/3089G06F 11/3096+6 more

AI classification

Planning1.00
Knowledge representation0.12
AI hardware0.01
Natural language0.00
Evolutionary computation0.00
Machine learning0.00
Vision0.00
Speech0.00

Ownership

XYRATEX TECHNOLOGY LIMITED

assignment · 311020826

Assignors

FAHIMI, FARSHAD, PIMLOTT, ROGER

On an employer assignment, the assignors are typically the inventors.

From the same owner

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