Structured Light 3-D Measurement Module and System for Illuminating an Area-under-test using a Fixed-pattern Optic

Patent №

US 9,506,749

Granted

2016-11-29

Filed 2011

Owner

SEIKOWAVE, INC.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13297233

A surface measurement module for 3-D triangulation-based image acquisition of a surface-under-inspection and under observation by at least one camera. The module having: (a) a casing housing an optical system comprising a plurality of lens elements positioned between a fixed-pattern optic and a light source; (b) an output of said fixed-pattern optic comprising a multi-frequency pattern comprising a plurality of pixels representing at least a first and second superimposed sinusoid projected simultaneously, each of the sinusoids represented by the pixels having a unique temporal frequency and each of the pixels projected to satisfy(c) a shifting element to spatially shift said output of said fixed-pattern optic during projection onto the surface-under-inspection; and (d) a plurality of images captured of said output of said fixed-pattern optic during projection onto the surface-under-inspection are used for the image acquisition.

VisionG01B 11/25G01B 11/2545

AI classification

Vision1.00
Planning0.19
Evolutionary computation0.00
AI hardware0.00
Natural language0.00
Machine learning0.00
Speech0.00
Knowledge representation0.00

Ownership

SEIKOWAVE, INC.

assignment · 272310864

Assignors

BELLIS, MATTHEW W., MR, LAU, DANIEL L., DR.

On an employer assignment, the assignors are typically the inventors.

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