Structured Light 3-D Measurement Module and System for Illuminating an Area-under-test using a Fixed-pattern Optic
Patent №
US 9,506,749
Granted
2016-11-29
Filed 2011
Owner
SEIKOWAVE, INC.
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
13297233
A surface measurement module for 3-D triangulation-based image acquisition of a surface-under-inspection and under observation by at least one camera. The module having: (a) a casing housing an optical system comprising a plurality of lens elements positioned between a fixed-pattern optic and a light source; (b) an output of said fixed-pattern optic comprising a multi-frequency pattern comprising a plurality of pixels representing at least a first and second superimposed sinusoid projected simultaneously, each of the sinusoids represented by the pixels having a unique temporal frequency and each of the pixels projected to satisfy(c) a shifting element to spatially shift said output of said fixed-pattern optic during projection onto the surface-under-inspection; and (d) a plurality of images captured of said output of said fixed-pattern optic during projection onto the surface-under-inspection are used for the image acquisition.
AI classification
Ownership
SEIKOWAVE, INC.
assignment · 272310864
Assignors
BELLIS, MATTHEW W., MR, LAU, DANIEL L., DR.
On an employer assignment, the assignors are typically the inventors.