METHOD FOR DETERMINING THE EDGES OF AN OVERLAPPING REGION BETWEEN A COLOR FILTER AND A BLACK MATRIX

Patent №

US 9,507,115

Granted

2016-11-29

Filed 2016

Owner

SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

14418192

Disclosed is a method for determining edges of an overlapping region between a color filter and a black matrix, which comprises the following steps. An original gray-scale value curve and a differential gray-scale value curve of the measurement area to be detected are drawn, and extremums of the differential gray-scale value curve are determined. A gray-scale value of the overlapping region between the color filter and the black matrix is obtained. A threshold value is established. Two extremums of the differential gray-scale value curve which are the closest to the two intersections respectively are obtained, and then the edges of the overlapping region between the color filter and the black matrix are determined based on the two extremums.

VisionG02B 7/003G01M 11/00G02B 5/003G02B 5/22G02F 1/1309G02F 1/1335G09G 3/2007G02F 1/133512+2 more

AI classification

Vision0.75
Planning0.01
Natural language0.00
Evolutionary computation0.00
AI hardware0.00
Knowledge representation0.00
Machine learning0.00
Speech0.00

Ownership

SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.

assignment · 363830246

Assignors

SHI, KAI, CHEN, LINDOU

On an employer assignment, the assignors are typically the inventors.

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