ELECTROCHEMICAL FORCE MICROSCOPY

Patent №

US 9,541,576

Granted

2017-01-10

Filed 2015

Owner

UT-BATTELLE, LLC

Lab

AI components

1

hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

14810605

A system and method for electrochemical force microscopy are provided. The system and method are based on a multidimensional detection scheme that is sensitive to forces experienced by a biased electrode in a solution. The multidimensional approach allows separation of fast processes, such as double layer charging, and charge relaxation, and slow processes, such as diffusion and faradaic reactions, as well as capturing the bias dependence of the response. The time-resolved and bias measurements can also allow probing both linear (small bias range) and non-linear (large bias range) electrochemical regimes and potentially the de-convolution of charge dynamics and diffusion processes from steric effects and electrochemical reactivity.

AI classification

AI hardware0.93
Planning0.09
Machine learning0.00
Vision0.00
Natural language0.00
Knowledge representation0.00
Speech0.00
Evolutionary computation0.00

Ownership

UT-BATTELLE, LLC

assignment · 363270137

Assignors

KALININ, SERGEI V., JESSE, STEPHEN

On an employer assignment, the assignors are typically the inventors.

From the same owner

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