Patent №
US 9,603,516
Granted
2017-03-28
Filed 2014
Owner
—
Lab
—
AI components
2
vision · kr
Assignment
None on record
Dataset
AIPD
2023_r1 edition
Application
14531926
A system and method for determining an objective quality metric for image data collected by a wavefront aberrometer. The method may include quantifying a plurality of characteristics of the image data and calculating the objective quality metric based on the quantified characteristics of the image data. The objective quality metric can be a weighted sum of the quantified characteristics of the image data. The weightings for the weighted sum can be determined based on subjective quality metrics assigned to a set of training image data by a human expert.