MEASUREMENT METHOD

Patent №

US 9,689,655

Granted

2017-06-27

Filed 2011

Owner

RENISHAW PLC

Lab

AI components

2

vision · planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13122499

This invention relates to a method for measuring a feature of an object that comprises obtaining a representation of at least the feature on the object by acquiring multiple data points via surface measurement of at least the feature. A model substantially replicating at least the feature of the object is fitted to the representation. The model comprises parameters defining at least two independently alterable portions that are linked at a common point. The fitting comprises changing the form of the model by altering at least one of the at least two independently alterable portions. The method also comprises obtaining information regarding at least the feature from the fitted model.

VisionPlanningG01B 5/008G01B 5/0032G01B 5/20G01B 21/04G01B 21/042G01B 21/20

AI classification

Vision0.98
Planning0.80
AI hardware0.06
Natural language0.00
Evolutionary computation0.00
Knowledge representation0.00
Machine learning0.00
Speech0.00

Ownership

RENISHAW PLC

assignment · 261100850

Assignors

GRZESIAK, JEAN-LOUIS

On an employer assignment, the assignors are typically the inventors.

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