HIERARCHICAL TEMPORAL CLUSTERING, METRIC CLUSTERING AND ATTRIBUTE CLUSTERING OF ELECTRONIC TERMINAL REPORTS TO IDENTIFY ELECTRONIC TERMINALS FOR ANALYSIS

Patent №

US 9,712,407

Granted

2017-07-18

Filed 2015

Owner

CA, INC.

Lab

AI components

3

kr · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

14708553

A method of performing operations on a processor of an application analysis computer includes obtaining reports from electronic terminals. The reports contain metrics for operation of instances of an application processed by the electronic terminals and attributes of the electronic terminals characterizing their application processing platforms. Metrics clusters of the reports are generated based on the metrics. Attribute clusters of the reports are generated based on the attributes contained in the reports of one of the metrics clusters which satisfy a defined metric rule. One of the attribute clusters, which contains reports obtained from less than a threshold number of distinct electronic terminals, is identified. Identifiers of the electronic terminals are determined based on the attributes contained in the reports in the one of the attribute clusters. Information is communicated based on the identifiers of the electronic terminals.

AI classification

Planning1.00
Knowledge representation1.00
AI hardware0.97
Machine learning0.15
Natural language0.03
Vision0.01
Speech0.00
Evolutionary computation0.00

Ownership

CA, INC.

assignment · 356060742

Assignors

SINGH, SATNAM, SAMA, VENKATABABJI

On an employer assignment, the assignors are typically the inventors.

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