Patent №
US 9,747,786
Granted
2017-08-29
Filed 2012
Owner
ITRON, INC.
Lab
—
AI components
1
hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
13717576
A distributed metering platform virtualizes functions of a conventional metrology sensor and separates the virtualized functions from a metrology sensor. One or more virtual meters or applications may be instantiated at a network communication device that is remote from the metrology sensor and processes metrology data received from the metrology sensor. Each virtual meter may include multiple partitioned application spaces that are isolated from one another. In one example, a first application space includes a locked version of code and a second application space includes an unlocked version of code. Furthermore, each virtual meter may be isolated from other virtual meters such that each virtual meter is unable to affect operations and/or data associated with other virtual meters.
AI classification
Ownership
ITRON, INC.
assignment · 300330420
Assignors
PONTIN, JOSEPH, LAKICH, DANIEL M., BUFFINGTON, JOHN
On an employer assignment, the assignors are typically the inventors.