VIRTUAL CLUSTER METER (VCM)

Patent №

US 9,747,786

Granted

2017-08-29

Filed 2012

Owner

ITRON, INC.

Lab

AI components

1

hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13717576

A distributed metering platform virtualizes functions of a conventional metrology sensor and separates the virtualized functions from a metrology sensor. One or more virtual meters or applications may be instantiated at a network communication device that is remote from the metrology sensor and processes metrology data received from the metrology sensor. Each virtual meter may include multiple partitioned application spaces that are isolated from one another. In one example, a first application space includes a locked version of code and a second application space includes an unlocked version of code. Furthermore, each virtual meter may be isolated from other virtual meters such that each virtual meter is unable to affect operations and/or data associated with other virtual meters.

AI hardwareG08C 19/00G01D 4/004Y02B 90/20Y04S 20/30

AI classification

AI hardware0.99
Evolutionary computation0.49
Knowledge representation0.01
Natural language0.00
Vision0.00
Machine learning0.00
Planning0.00
Speech0.00

Ownership

ITRON, INC.

assignment · 300330420

Assignors

PONTIN, JOSEPH, LAKICH, DANIEL M., BUFFINGTON, JOHN

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC