X-RAY BACKSCATTERING SAFETY INSPECTION SYSTEM HAVING A DISTRIBUTED-TYPE X-RAY SOURCE AND METHOD USING THE SAME
Patent №
US 9,846,258
Granted
2017-12-19
Filed 2015
Owner
NUCTECH COMPANY LIMITED
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
14792066
The present disclosure provides an X-ray backscattering safety inspection system, comprising: one or more backscattering inspection subsystem configured to inspect an object to be inspected by emitting X-ray beams towards the object to be inspected and inspecting scattering signals; and a control subsystem configured to adjust a distance between the backscattering inspection subsystem and locations on a side of the object to be inspected where are irradiated by the X-ray beams in real time according to a size of the object to be inspected such that the scattering signals inspected are optimized. The system may be adapted to objects to be inspected with different sizes or shapes while enhancing backscattering signals for imaging.
AI classification
Ownership
NUCTECH COMPANY LIMITED
assignment · 369280047
Assignors
CHEN, ZHIQIANG, LI, YUANJING, ZHAO, ZIRAN, WU, WANLONG, JIN, YINGKANG, TANG, LE, XU, CHENGCONG, RUAN, MING, DING, GUANGWEI
On an employer assignment, the assignors are typically the inventors.