METHOD FOR MEASURING THE EFFECT OF MICROSCOPIC HARDWARE FAULTS IN HIGH-COMPLEXITY APPLICATIONS IMPLEMENTED IN A HARDWARE ELECTRONIC SYSTEM, AND CORRESPONDING SYSTEM AND COMPUTER PROGRAM PRODUCT

A method for measuring the effect of microscopic hardware faults in high-complexity applications includes carrying out on a processing system a step of simulation of an electronic system that executes a software instance of the application. The simulation step includes injecting faults at a microscopic level and measuring a corresponding final effect. The operation of injecting faults includes selecting a microscopic fault to be injected, selecting a mutant corresponding to the microscopic fault, applying the selected mutant to the software instance to obtain a mutated instance, simulating the electronic system that executes the mutated instance, and measuring the corresponding effect.