METHOD FOR DETECTING PARTICLES AND DEFECTS AND INSPECTION EQUIPMENT THEREOF

Patent №

US RE44840

Granted

2014-04-15

Filed 2013

Owner

Lab

AI components

1

vision

Assignment

None on record

Dataset

AIPD

2023_r1 edition

Application

13743245

A method and equipment which includes an illustrated-spot illumination-distribution data table for storing an illumination distribution within an illustrated spot and which calculates a coordinate position for a particle or a defect and the diameter of the particle on the basis of detection light intensity data about the particle or defect and the illustrated-spot illumination-distribution data table. Thus, even when the illumination distribution within the illustrated spot based on an actual illumination optical system is not a Gaussian distribution, the calculation of the particle diameter of the detected particle or defect and the calculation of a coordinate position on the surface of an object to be inspected can be attained with an increased accuracy.

AI classification

Vision0.91
Machine learning0.00
AI hardware0.00
Natural language0.00
Evolutionary computation0.00
Speech0.00
Planning0.00
Knowledge representation0.00
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