Patent №
US 10,089,161
Granted
2018-10-02
Filed 2017
Owner
INTERNATIONAL BUSINESS MACHINES CORPORATION
Lab
AI components
2
planning · evo
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
15805414
The present disclosure generally provides for a method of managing semiconductor manufacturing defects. The method includes: determining a cumulative aging parameter for each of a plurality of first IC products produced with a particular manufacturing line, the cumulative aging parameter being dependent on a product operating condition; calculating an observed defect rate for the plurality of first IC products based on a difference between a predicted value of the aging parameter and the cumulative aging parameter for each of the plurality of first IC products; and adjusting a manufacturing reliability model for the particular manufacturing line in response to the observed defect rate being different from a predicted defect rate for the plurality of first IC products.
AI classification
Ownership
INTERNATIONAL BUSINESS MACHINES CORPORATION
assignment · 440520066
Assignors
BICKFORD, JEANNE P.S., HABIB, NAZMUL, LI, BAOZHEN, NSAME, PASCAL A.
On an employer assignment, the assignors are typically the inventors.