METHOD, APPARATUS, AND SYSTEM FOR MONITORING MANUFACTURING EQUIPMENT

Patent №

US 10,152,879

Granted

2018-12-11

Filed 2015

Owner

INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Lab

AI components

3

kr · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

14936787

A method for monitoring a manufacturing apparatus includes collecting a control signal, of a controller and a corresponding sensing signal, of the manufacturing apparatus over a predetermined period of time; segmenting the control signal and the corresponding sensing signal to obtain at least one control step; calculating a character of the controller based on at least one of the control signal, the sensing signal, the at least one control step, or information from a user manual; generating, based on the character, a health index indicating health of the controller; and generating a warning signal when the health index exceeds a predetermined threshold.

Knowledge representationPlanningAI hardwareG08B 29/185G05B 19/0428G05B 23/00G05B 23/0235G08B 21/182G05B 23/0272

AI classification

Planning1.00
AI hardware0.92
Knowledge representation0.90
Machine learning0.35
Vision0.00
Natural language0.00
Speech0.00
Evolutionary computation0.00

Ownership

INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

assignment · 370800433

Assignors

CHEN, TE-MING, CHANG, SEN-CHIA, LAI, CHIEN-LIANG, DAY, CHI-TING

On an employer assignment, the assignors are typically the inventors.

From the same owner

© 2026 NYSGPT2525 LLC