HETERODYNE SCANNING PROBE MICROSCOPY METHOD AND SCANNING PROBE MICROSCOPY SYSTEM

Patent №

US 11,635,448

Granted

2023-04-25

Filed 2021

Owner

NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

17612507

The present document relates to a heterodyne scanning probe microscopy (SPM) method for subsurface imaging, and includes: applying an acoustic input signal to a sample and sensing an acoustic output signal using a probe. The acoustic input signal comprises a plurality of signal components at unique frequencies, including a carrier frequency and at least two excitation frequencies. The carrier frequency and the excitation frequencies form a group of frequencies, which are distributed with an equal difference frequency between each two subsequent frequencies of the group. The difference frequency is below a sensitivity threshold frequency of the cantilever for enabling sensing of the acoustic output signal. The document also describes an SPM system.

PlanningG01Q 60/32G01N 29/06G01N 29/0681G01N 29/343G01N 29/348G01N 29/4436G01Q 20/02G01Q 60/366

AI classification

Planning0.76
AI hardware0.28
Knowledge representation0.11
Natural language0.00
Evolutionary computation0.00
Vision0.00
Machine learning0.00
Speech0.00

Ownership

NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO

assignment · 584800764

Assignors

RAJADURAI, SRI RAM SHANKAR, PIRAS, DANIELE, HATAKEYAMA, KODAI, VAN NEER, PAUL LOUIS MARIA JOSEPH, VAN ES, MAARTEN HUBERTUS, MARNANI, HAMED SADEGHIAN, VAN DER LANS, MARCUS JOHANNES

On an employer assignment, the assignors are typically the inventors.

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