Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)

Patent №

US 11,635,449

Granted

2023-04-25

Filed 2022

Owner

BRUKER NANO, INC.

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

17722603

An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

PlanningG01Q 60/366G01Q 60/38G01N 3/42G01Q 10/04G01Q 10/06G01Q 20/04G01Q 30/04B82Y 35/00+5 more

AI classification

Planning0.98
AI hardware0.05
Evolutionary computation0.03
Natural language0.01
Speech0.00
Knowledge representation0.00
Machine learning0.00
Vision0.00

Ownership

BRUKER NANO, INC.

assignment · 596270523

Assignors

OSECHINSKIY, SERGEY, RUITER, ANTHONIUS, PITTENGER, BEDE, SYED-AMANULLA, SYED-ASIF

On an employer assignment, the assignors are typically the inventors.

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