IMAGE FOCUSING METHOD AND APPARATUS FOR ELECTRON MICROSCOPE

Patent №

US 4,724,319

Granted

1988-02-09

Filed 1986

Owner

AKASHI SEISAKUSHO LTD.

+2 more

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

06848021

A method and apparatus for automatically focussing a specimen image in an electron microscope. Excitation currents for an objective lens of the microscope are previously determined in accordance with predetermined magnifications in one-to-one correspondence. When one of the magnifications is selected, the objective lens is automatically excited with the current corresponding to the magnification, whereby the specimen image is automatically properly focussed.

AI classification

Vision0.80
Evolutionary computation0.02
Natural language0.01
AI hardware0.00
Machine learning0.00
Speech0.00
Knowledge representation0.00
Planning0.00

Ownership

AKASHI SEISAKUSHO LTD.

assignment · 47520990

ABT LTD.

assignment · 56500605

KABUSHIKI KAISHA TOPCON A CORPORATION OF JAPAN

assignment · 57820144

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