METHOD AND APPARATUS FOR DETECTING A CIRCUIT PATTERN

Patent №

US 5,331,407

Granted

1994-07-19

Filed 1992

Owner

HITACHI, LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

07845723

A method and apparatus for detecting a circuit pattern comprise a stage for mounting an object under inspection having a circuit pattern to be detected, means of generating a signal in response to the amount of movement of the stage, a detection optical system for detecting the circuit pattern, an opto-electric transducer which receives the image of the pattern provided by the detection optical system and transforms the image into an image signal, means of calculating the amount of expansion or contraction of the object by detecting the distance between specific patterns on the object, and drive control means which produces a clock signal for the opto-electric transducer based on the stage movement signal provided by the signal generation means and varies the clock signal so as to vary the dimension of the detected image arbitrarily.

AI classification

Vision0.84
AI hardware0.01
Natural language0.00
Evolutionary computation0.00
Speech0.00
Machine learning0.00
Knowledge representation0.00
Planning0.00

Ownership

HITACHI, LTD.

assignment · 68670843

Assignors

DOI, HIDEAKI, HARA, YASUHIKO, KARASAKI, KOICHI

On an employer assignment, the assignors are typically the inventors.

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