METHOD AND APPARATUS FOR DETERMINING A SET OF TESTS FOR INTEGRATED CIRCUIT TESTING

Patent №

US 5,935,264

Granted

1999-08-10

Filed 1997

Owner

MICRON TECHNOLOGY, INC.

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08872240

The present invention is directed to a system comprised of a computer, at least one integrated circuit tester, a communications link enabling communications between the integrated circuit tester and the computer, and a computer-readable medium. The computer-readable medium contains a sequence of instructions that, when executed, create a set of tests for integrated circuit testing. The set of tests may include only those tests that are calculated to be statistically significant. A second set of tests may be created that includes only those tests that are calculated to be statistically insignificant. The computer monitors the test results and moves tests between the two sets to ensure that only statistically significant tests are in the first group and that only statistically insignificant tests are in the second group.

PlanningG01R 31/31835G01R 31/287G01R 31/318307G01R 31/319G01R 31/31903

AI classification

Planning0.97
Evolutionary computation0.48
Knowledge representation0.41
AI hardware0.04
Natural language0.00
Machine learning0.00
Vision0.00
Speech0.00

Ownership

MICRON TECHNOLOGY, INC.

assignment · 87890445

Assignors

NEVILL, LELAND R., NGUYEN, THAN HUU, FORD, BRUCE J. JR., BARNETT, GREGORY A.

On an employer assignment, the assignors are typically the inventors.

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