Patent №
US 6,173,604
Granted
2001-01-16
Filed 1998
Owner
REGENTS OF THE UNIVERSITY OF CALIFORNIA, THE
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09158037
A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and quantitative measurements of the electrical properties of the sample. The inventive scanning evanescent wave electromagnetic microscope (SEMM) can map dielectric constant, tangent loss, conductivity, complex electrical impedance, and other electrical parameters of materials. The quantitative map corresponds to the imaged detail. The novel microscope can be used to measure electrical properties of both dielectric and electrically conducting materials.
AI classification
Ownership
REGENTS OF THE UNIVERSITY OF CALIFORNIA, THE
assignment · 96280138
Assignors
XIANG, XIAO-DONG, GAO, CHEN
On an employer assignment, the assignors are typically the inventors.