Patent №
US 7,109,482
Granted
2006-09-19
Filed 2004
Owner
—
Lab
—
AI components
1
planning
Assignment
None on record
Dataset
AIPD
2023_r1 edition
Application
10875151
A scanning probe microscope system (100) includes an objective lens (147), a clamping circuit (404), a tip deflection measurement circuit (421), a cantilever (136), and a probe (137) for modifying and inspecting an object (102) disposed on a stage (129).
AI classification
Planning0.63
AI hardware0.03
Vision0.01
Machine learning0.00
Evolutionary computation0.00
Natural language0.00
Knowledge representation0.00
Speech0.00