METHOD TO EXTRACT CIRCUIT INFORMATION

Patent №

US 6,236,746

Granted

2001-05-22

Filed 1997

Owner

SEMICONDUCTOR INSIGHTS INC.

+1 more

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

08942113

A method for analyzing an integrated circuit (IC). At least a portion of a layer of the IC is scanned using high magnification, to obtain images of the IC. The images are registered to create a mosaicked image. An IC layout database is created in the form of a set of polygons from the mosaicked image, where the step of creating the IC layout database is performed after, or pipelined with, the registering step. The process is repeated for plural IC layers, as necessary. Polygon sets from each layer are vertically registered into alignment with minimal distortion. A netlist or schematic diagram is generated to represent the scanned IC portion based on the registered set(s) of polygons.

AI classification

Vision1.00
Natural language0.00
Planning0.00
Evolutionary computation0.00
Knowledge representation0.00
AI hardware0.00
Speech0.00
Machine learning0.00

Ownership

SEMICONDUCTOR INSIGHTS INC.

assignment · 88470460

ORISAR INC.

namechg · 118950286

Assignors

CHAMBERLAIN, GEORGE, IOUDOVSKI, ALEXEI, THOMAS, JOHN SCOTT, NAIM, GHASSAM

On an employer assignment, the assignors are typically the inventors.

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