SCANNING PROBE MICROSCOPE ASSEMBLY AND METHOD FOR MAKING CONFOCAL, SPECTROPHOTOMETRIC, NEAR-FIELD, AND SCANNING PROBE MEASUREMENTS AND ASSOCIATED IMAGES
Patent №
US 6,281,491
Granted
2001-08-28
Filed 1999
Owner
—
Lab
—
AI components
1
vision
Assignment
None on record
Dataset
AIPD
2023_r1 edition
Application
09249567
A scanning probe microscope assembly and corresponding method for making confocal, spectrophotometric, near-field, and scanning probe measurements and forming associated images from the measurements.
AI classification
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AI hardware0.01
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