Patent №
US 6,424,876
Granted
2002-07-23
Filed 1999
Owner
ADVANCED MICRO DEVICES, INC.
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09359988
A method for monitoring the performance of a manufacturing entity is provided. Metrology data indicating an output parameter of the manufacturing entity is retrieved. The output parameter has an associated target value. The metrology data is normalized based on the target value to generate normalized performance data points. A performance rule violation is determined based on the normalized performance data. A manufacturing system includes a metrology tool, a first database, and a processor. The metrology tool is adapted to measure an output parameter of a manufacturing entity to generate metrology data. The output parameter has an associated target value. The first database is adapted to receive the metrology data. The processor is adapted to retrieve the metrology data from the database, normalize the metrology data based on the target value to generate normalized performance data points, and determine a performance rule violation based on the normalized performance data.
AI classification
Ownership
ADVANCED MICRO DEVICES, INC.
assignment · 101240304
Assignors
CUSSON, BRIAN K., SHARIER, JAMES, GIGUERE, JUSTIN, OSHELSKI, ANASTASIA
On an employer assignment, the assignors are typically the inventors.