STATISTICAL PROCESS CONTROL SYSTEM WITH NORMALIZED CONTROL CHARTING

Patent №

US 6,424,876

Granted

2002-07-23

Filed 1999

Owner

ADVANCED MICRO DEVICES, INC.

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09359988

A method for monitoring the performance of a manufacturing entity is provided. Metrology data indicating an output parameter of the manufacturing entity is retrieved. The output parameter has an associated target value. The metrology data is normalized based on the target value to generate normalized performance data points. A performance rule violation is determined based on the normalized performance data. A manufacturing system includes a metrology tool, a first database, and a processor. The metrology tool is adapted to measure an output parameter of a manufacturing entity to generate metrology data. The output parameter has an associated target value. The first database is adapted to receive the metrology data. The processor is adapted to retrieve the metrology data from the database, normalize the metrology data based on the target value to generate normalized performance data points, and determine a performance rule violation based on the normalized performance data.

PlanningG06Q 10/06G06F 17/18

AI classification

Planning1.00
Knowledge representation0.12
Evolutionary computation0.00
Vision0.00
Natural language0.00
AI hardware0.00
Machine learning0.00
Speech0.00

Ownership

ADVANCED MICRO DEVICES, INC.

assignment · 101240304

Assignors

CUSSON, BRIAN K., SHARIER, JAMES, GIGUERE, JUSTIN, OSHELSKI, ANASTASIA

On an employer assignment, the assignors are typically the inventors.

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