MULTI-LEVEL SCANNING METHOD FOR DEFECT INSPECTION

Patent №

US 6,484,306

Granted

2002-11-19

Filed 1999

Owner

REGENTS OF THE UNIVERSITY OF CALIFORNIA, THE

+1 more

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09466730

A method for performing scanned defect inspection of a collection of contiguous areas using a specified false-alarm-rate and capture-rate within an inspection system that has characteristic seek times between inspection locations. The multi-stage method involves setting an increased false-alarm-rate for a first stage of scanning, wherein subsequent stages of scanning inspect only the detected areas of probable defects at lowered values for the false-alarm-rate. For scanning inspection operations wherein the seek time and area uncertainty is favorable, the method can substantially increase inspection throughput.

VisionG06T 7/0006G06T 2207/30148

AI classification

Vision0.99
Machine learning0.01
Knowledge representation0.01
Natural language0.00
Planning0.00
Speech0.00
AI hardware0.00
Evolutionary computation0.00

Ownership

REGENTS OF THE UNIVERSITY OF CALIFORNIA, THE

assignment · 106260562

EUV LLC

assignment · 146010343

Assignors

JEONG, SEONGTAE, BOKOR, JEFFREY

On an employer assignment, the assignors are typically the inventors.

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