IN-SITU TESTING OF A MEMS ACCELEROMETER IN A DISC STORAGE SYSTEM

A disc storage system performing an in-situ test on a MEMS accelerometer, in a disc drive. The circuit includes a control circuit that establishes a desired self test condition conducive to the in-situ test during a self test interval. The circuit includes a stored reference representing at least one characteristic limit of an integrity output of the, MEMS accelerometer. The circuit includes a test circuit that receives the integrity output value and the stored reference during the in-situ test interval and that generates an in-situ test output representative of integrity of the MEMS accelerometer. Damaged or degraded MEMS accelerometers can be diagnosed in-situ.