HIERARCHICAL BUILT-IN SELF-TEST FOR SYSTEM-ON-CHIP DESIGN

Patent №

US 6,728,916

Granted

2004-04-27

Filed 2001

Owner

IBM CORPORATION

AI components

1

hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09863952

Hierarchical built-in self-test methods and arrangement for verifying system functionality. As a result, an effective built-in self-test methodology is provided for conducting complete system-on-chip testing, to ensure both the circuit reliability and performance of system-on-chip design. As an added advantage, development costs are reduced for system-on-chip applications.

AI classification

AI hardware0.82
Planning0.12
Machine learning0.07
Knowledge representation0.01
Natural language0.01
Evolutionary computation0.00
Speech0.00
Vision0.00

Ownership

IBM CORPORATION

assignment · 118570385

Assignors

CHEN, HOWARD H., HSU, LOUIS L., WANG, LI-KONG

On an employer assignment, the assignors are typically the inventors.

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