METHOD AND CIRCUITS FOR TESTING HIGH SPEED DEVICES USING LOW SPEED ATE TESTERS

A bridge circuit disposed between a device under test (DUT) and conventional automatic test equipment (ATE) extends the performance of the ATE. The bridge circuit allows the ATE to test ICs capable of operating at frequencies above the ATE's normal performance limits. In some embodiments, the bridge circuit also extends ATE functionality, providing frame alignment and automatic test-vector generation, for example, and can increase the number of available test channels.