PYROMETER CALIBRATED WAFER TEMPERATURE ESTIMATOR

Patent №

US 6,924,463

Granted

2005-08-02

Filed 2003

Owner

Lab

AI components

1

ml

Assignment

None on record

Dataset

AIPD

2023_r1 edition

Application

10459835

A wafer temperature estimator calibrates contact-type temperature sensor measurements that are used by a temperature controller to control substrate temperature in a high temperature processing chamber. Wafer temperature estimator parameters provide an estimated wafer temperature from contact-type temperature sensor measurements. The estimator parameters are refined using non-contact-type temperature sensor measurements during periods when the substrate temperature is decreasing or the heaters are off. A corresponding temperature control system includes a heater, a contact-type temperature sensor in close proximity to the substrate, and an optical pyrometer placed to read temperature directly from the substrate. A wafer temperature estimator uses the estimator parameters and measurements from the contact-type sensor to determine an estimated wafer temperature. A temperature controller reads the estimated wafer temperature and makes changes to the heater power accordingly. The wafer temperature estimator has a nonlinear neural network system that is trained using inputs from the various sensors.

Machine learningH01L 21/67248H10P 72/0602C30B 25/16

AI classification

Machine learning0.59
Speech0.03
Planning0.01
AI hardware0.01
Vision0.00
Knowledge representation0.00
Evolutionary computation0.00
Natural language0.00
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