METHODS AND SYSTEMS FOR CONTROLLING A SEMICONDUCTOR FABRICATION PROCESS

Patent №

US 8,639,489

Granted

2014-01-28

Filed 2007

Owner

Lab

AI components

2

ml · planning

Assignment

None on record

Dataset

AIPD

2023_r1 edition

Application

11877096

Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.

Machine learningPlanningG05B 19/41885G05B 2219/31467G05B 2219/31472G05B 2219/32335G05B 2219/32342G05B 2219/35494Y02P 90/02Y02P 90/80

AI classification

Planning1.00
Machine learning1.00
AI hardware0.37
Evolutionary computation0.07
Knowledge representation0.06
Vision0.01
Natural language0.01
Speech0.00
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