ALIGNING METHOD, EXPOSURE METHOD, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
Patent №
US 7,212,286
Granted
2007-05-01
Filed 2002
Owner
CANON KABUSHIKI KAISHA
Lab
—
AI components
1
evo
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10178234
A method of selecting alignment marks, to be detected, from a plurality of alignment marks formed on a substrate includes the step of calculating a deviation between a distance of a designed position of an alignment mark from a reference position and a reference value, with respect to each of the plurality of alignment marks. The alignment marks, to be detected, are selected based on the deviations.
AI classification
Ownership
CANON KABUSHIKI KAISHA
assignment · 130490353
Assignors
HOSHI, TAI
On an employer assignment, the assignors are typically the inventors.