ALIGNING METHOD, EXPOSURE METHOD, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

Patent №

US 7,212,286

Granted

2007-05-01

Filed 2002

Owner

CANON KABUSHIKI KAISHA

Lab

AI components

1

evo

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10178234

A method of selecting alignment marks, to be detected, from a plurality of alignment marks formed on a substrate includes the step of calculating a deviation between a distance of a designed position of an alignment mark from a reference position and a reference value, with respect to each of the plurality of alignment marks. The alignment marks, to be detected, are selected based on the deviations.

AI classification

Evolutionary computation0.97
Knowledge representation0.01
Natural language0.00
Vision0.00
Planning0.00
Speech0.00
Machine learning0.00
AI hardware0.00

Ownership

CANON KABUSHIKI KAISHA

assignment · 130490353

Assignors

HOSHI, TAI

On an employer assignment, the assignors are typically the inventors.

From the same owner

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