THREE-DIMENSIONAL (3D) MEASURING WITH MULTIPLE REFERENCE FRAMES

Patent №

US 7,307,737

Granted

2007-12-11

Filed 2004

Owner

SNAP-ON INCORPORATED

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10960293

A measurement system processes data representing an images of an optical target, e.g. on a contact probe, to determine position of each of a number of points on a vehicle or other object. The system uses two reference frames and processes an image of the two frames, to define a three-dimensional (3D) coordinate system, for example, in relation to a designated first frame. The image processing determines the position of the other frame in that coordinate system. For any measurement in which the first reference frame is visible in an image with the probe, processing directly determines position of the point in the 3D coordinate system. For any measurement in which that reference frame is not sufficiently visible, but the second reference frame is sufficiently visible, the image processing determines position relative to the second reference frame and transforms that position into a measurement in the defined three-dimensional coordinate system.

VisionG01B 11/002G01B 11/16

AI classification

Vision0.81
Knowledge representation0.00
Evolutionary computation0.00
AI hardware0.00
Natural language0.00
Speech0.00
Planning0.00
Machine learning0.00

Ownership

SNAP-ON INCORPORATED

assignment · 161520244

Assignors

KLING, MICHAEL J., III, MASHBURN, JAMES F., BROWN, ADAM C., ROGERS, STEVEN W.

On an employer assignment, the assignors are typically the inventors.

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