METHOD FOR MEASUREMENT OF THREE-DIMENSIONAL OBJECTS BY SINGLE-VIEW BACKLIT SHADOWGRAPHY

Patent №

US 7,307,740

Granted

2007-12-11

Filed 2005

Owner

COMMISSARIAT A L'ENERGIE ATOMIQUE

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10547783

A method for measuring three-dimensional objects by single view backlit shadowgraphy. To measure at least one geometrical parameter of such an object, for example the thickness of a hollow sphere, translucent or transparent to visible light, optical characteristics of the object are determined, by which at least one optical model of the propagation of light through the object is established. This model includes an equation that relates the parameter to the result of an observation directly performed on an image of the object, the object being acquired by observing the object by single view backlit shadowgraphy. The image is acquired, the observation is performed, and the parameter is determined by the equation and the result of the observation.

VisionG01B 11/06G01B 11/08

AI classification

Vision1.00
Planning0.01
Natural language0.00
Knowledge representation0.00
Speech0.00
AI hardware0.00
Evolutionary computation0.00
Machine learning0.00

Ownership

COMMISSARIAT A L'ENERGIE ATOMIQUE

assignment · 172930289

Assignors

LAMY, FRANCIS, PASCAL, GHISLAIN, VOISIN, YVON, DIOU, ALAIN

On an employer assignment, the assignors are typically the inventors.

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