METHOD FOR MEASUREMENT OF THREE-DIMENSIONAL OBJECTS BY SINGLE-VIEW BACKLIT SHADOWGRAPHY
Patent №
US 7,307,740
Granted
2007-12-11
Filed 2005
Owner
COMMISSARIAT A L'ENERGIE ATOMIQUE
Lab
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AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10547783
A method for measuring three-dimensional objects by single view backlit shadowgraphy. To measure at least one geometrical parameter of such an object, for example the thickness of a hollow sphere, translucent or transparent to visible light, optical characteristics of the object are determined, by which at least one optical model of the propagation of light through the object is established. This model includes an equation that relates the parameter to the result of an observation directly performed on an image of the object, the object being acquired by observing the object by single view backlit shadowgraphy. The image is acquired, the observation is performed, and the parameter is determined by the equation and the result of the observation.
AI classification
Ownership
COMMISSARIAT A L'ENERGIE ATOMIQUE
assignment · 172930289
Assignors
LAMY, FRANCIS, PASCAL, GHISLAIN, VOISIN, YVON, DIOU, ALAIN
On an employer assignment, the assignors are typically the inventors.