Patent №
US 7,409,306
Granted
—
Owner
—
Lab
—
AI components
3
ml · planning · evo
Assignment
None on record
Dataset
AIPD
2023_r1 edition
Application
11715172
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.
AI classification
Evolutionary computation0.99
Machine learning0.75
Planning0.66
Natural language0.01
AI hardware0.01
Knowledge representation0.00
Vision0.00
Speech0.00