METHODS AND SYSTEMS FOR SEMICONDUCTOR TESTING USING A TESTING SCENARIO LANGUAGE

Patent №

US 7,567,947

Granted

2009-07-28

Filed 2006

Owner

OPTIMALTEST LTD.

+1 more

Lab

AI components

5

ml · nlp · kr · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11396938

Methods and systems for semiconductor testing. In one embodiment, a semiconductor testing method includes one or more of the following stages: defining a rule relating to semiconductor testing, validating the rule, bundling the rule with other rules, correlating the rule with other rules, publishing the rule, actualizing the rule, and follow up relating to the rule. In one embodiment, a semiconductor testing system includes one or more of the following modules: rule creation module(s), analysis module(s), simulation module(s), real time production module(s), and offline production module(s). In one embodiment, user friendly graphical user interface(s) can be used for defining the building blocks of a rule and/or for viewing an optional hierarchy of categories to which the rule belongs.

AI classification

Planning1.00
Knowledge representation1.00
Machine learning0.98
Natural language0.74
AI hardware0.58
Evolutionary computation0.01
Vision0.00
Speech0.00

Ownership

OPTIMALTEST LTD.

assignment · 177420829

OPTIMAL PLUS LTD

namechg · 332950398

Assignors

BALOG, GIL

On an employer assignment, the assignors are typically the inventors.

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