SYSTEMS AND METHODS FOR TEST TIME OUTLIER DETECTION AND CORRECTION IN INTEGRATED CIRCUIT TESTING
Patent №
US 7,969,174
Granted
2011-06-28
Filed 2009
Owner
OPTIMALTEST LTD.
Lab
—
AI components
2
planning · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
12418024
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
AI classification
Planning0.97
AI hardware0.81
Natural language0.01
Machine learning0.01
Knowledge representation0.00
Evolutionary computation0.00
Speech0.00
Vision0.00
Ownership
OPTIMALTEST LTD.
assignment · 560240281
Assignors
BALOG, GIL, LINDE, REED, GOLAN, AVI
On an employer assignment, the assignors are typically the inventors.
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