SAMPLE INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, AND PROGRAM-RECORDED READABLE RECORDING MEDIUM
Patent №
US 7,577,288
Granted
2009-08-18
Filed 2005
Owner
ADVANCED MASK INSPECTION TECHNOLOGY INC.
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
11287419
A sample inspection apparatus according to an aspect of the present invention includes a first SSD calculating unit which calculates the displacement amount from a preliminary alignment position of an optical image and a reference image to a position where the SSD of a pixel value of the optical image and a pixel value of the reference image is minimized, and a least-square method calculating unit which calculates the displacement amount by a least-square method from the preliminary alignment position of the optical image and the reference image, wherein the alignment position of the optical image and the reference image is corrected to a position where the smaller SSD of the minimum SSD obtained as the result of the calculation by the first SSD calculating unit and the SSD obtained as the result of the calculation by the determined by the least-square method calculating unit is obtained.
AI classification
Ownership
ADVANCED MASK INSPECTION TECHNOLOGY INC.
assignment · 172920749
Assignors
YAMASHITA, KYOJI
On an employer assignment, the assignors are typically the inventors.