SAMPLE INSPECTION APPARATUS, IMAGE ALIGNMENT METHOD, AND PROGRAM-RECORDED READABLE RECORDING MEDIUM

Patent №

US 7,577,288

Granted

2009-08-18

Filed 2005

Owner

ADVANCED MASK INSPECTION TECHNOLOGY INC.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11287419

A sample inspection apparatus according to an aspect of the present invention includes a first SSD calculating unit which calculates the displacement amount from a preliminary alignment position of an optical image and a reference image to a position where the SSD of a pixel value of the optical image and a pixel value of the reference image is minimized, and a least-square method calculating unit which calculates the displacement amount by a least-square method from the preliminary alignment position of the optical image and the reference image, wherein the alignment position of the optical image and the reference image is corrected to a position where the smaller SSD of the minimum SSD obtained as the result of the calculation by the first SSD calculating unit and the SSD obtained as the result of the calculation by the determined by the least-square method calculating unit is obtained.

VisionG06T 7/001G01N 21/95607G03F 1/84G06T 7/32G06V 10/7515G06T 2207/30148

AI classification

Vision1.00
Evolutionary computation0.03
AI hardware0.00
Natural language0.00
Knowledge representation0.00
Planning0.00
Machine learning0.00
Speech0.00

Ownership

ADVANCED MASK INSPECTION TECHNOLOGY INC.

assignment · 172920749

Assignors

YAMASHITA, KYOJI

On an employer assignment, the assignors are typically the inventors.

From the same owner

© 2026 NYSGPT2525 LLC