Patent №
US 7,707,526
Granted
2010-04-27
Filed 2007
Owner
SYNOPSYS, INC.
Lab
—
AI components
2
evo · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
11805916
One embodiment of the present invention provides a system that predicts a manufacturing yield of a chip. During operation, the system first receives a chip layout. Next, the system identifies hotspots within the chip layout, wherein a hotspot is a location within the chip layout wherein a yield-indicative variable value falls in a low manufacturable range. The system then obtains yield scores for the hotspots, wherein a yield score indicates a failure probability for a corresponding hotspot. Next, the system predicts the manufacturing yield for the chip based on the hotspots and the yield scores for the hotspots.
AI classification
Ownership
SYNOPSYS, INC.
assignment · 194120514
Assignors
SU, QING, CHIANG, CHARLES C.
On an employer assignment, the assignors are typically the inventors.