SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF TESTING SAME

A semiconductor integrated circuit includes an MISR (Multiple-Input Signature Register) for generating and storing compressed code based upon code from a ROM, and for reading out and outputting the compressed data that has been stored. The MISR has a clock change-over unit for changing over a clock in such a manner that the MISR is caused to operate at a high-speed clock when the compressed data is generated and stored, and at a low-speed clock when the stored compressed data is read out and output.