FOREIGN MATTER INSPECTION APPARATUS

Patent №

US 7,898,653

Granted

2011-03-01

Filed 2007

Owner

HITACHI HIGH-TECHNOLOGIES CORPORATION

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

12003123

Selection with alignment marks of an optimal template, its identification and similarity judgment are conducted by a calculation function of a correlation value provided to a foreign matter inspection apparatus. In other words, the foreign matter inspection apparatus includes unit for registering feature points of alignment marks formed on a surface of an inspected object, unit for collecting image data of the alignment marks formed on the surface of the inspected object and a data processor for extracting a feature point from the image data and calculating a correlation value of both feature points, and registers the image data of the alignment mark on the basis of a threshold value of the correlation value.

VisionG01N 21/9501G01N 21/94G01N 21/95607

AI classification

Vision1.00
AI hardware0.03
Natural language0.00
Evolutionary computation0.00
Speech0.00
Machine learning0.00
Planning0.00
Knowledge representation0.00

Ownership

HITACHI HIGH-TECHNOLOGIES CORPORATION

assignment · 203350471

Assignors

IMAI, EIJI, OOYAMA, MASAMI, OKAMOTO, HIDEYUKI, YAMASHITA, HIROYUKI

On an employer assignment, the assignors are typically the inventors.

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