METHOD AND APPARATUS FOR SCHEDULING TEST VECTORS IN A MULTIPLE CORE INTEGRATED CIRCUIT

A computer implemented method, apparatus and computer program product for extending test coverage in a simulated multiple core integrated circuit. The simulator applies at a first time a first test vector on the simulated multiple core integrated circuit, the first test vector having a duration. The simulator may also apply a second test vector at a second time before the duration but substantially after the first time. The simulator can collect a response from the multiple core integrated circuit based on the first test vector and the second test vector.