Patent №
US 7,974,734
Granted
2011-07-05
Filed 2005
Owner
DRESSER, INC.
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10534679
Control system of an electronic instrument for metrological measurements, comprising an electronic local processing unit including a handling application of said instrument. The system includes a control application for said handling application, which can be associated with said local processing unit, said control application being suitable for generating a univocal certification code for the application.
AI classification
Planning0.88
Natural language0.23
Knowledge representation0.04
Machine learning0.01
Vision0.00
Evolutionary computation0.00
AI hardware0.00
Speech0.00
Ownership
DRESSER, INC.
assignment · 187320574
From the same owner
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