ERROR SCANNING IN FLASH MEMORY

Patent №

US 8,095,835

Granted

2012-01-10

Filed 2010

Owner

Lab

AI components

1

planning

Assignment

None on record

Dataset

AIPD

2023_r1 edition

Application

12846629

Various embodiments include methods, apparatus, and systems to scan at least a portion of a memory device for potential errors when a condition for scanning is met. The condition may be dependent on one or more of a number of read operations, a number of write operations, time, and others. Other embodiments including additional methods, apparatus, and systems are disclosed.

PlanningG06F 11/006G06F 11/106

AI classification

Planning0.51
AI hardware0.40
Natural language0.26
Knowledge representation0.01
Evolutionary computation0.01
Machine learning0.00
Speech0.00
Vision0.00
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