METHODS, SYSTEMS AND APPARATUS FOR DEFECT DETECTION AND CLASSIFICATION

Patent №

US 8,995,747

Granted

2015-03-31

Filed 2010

Owner

SHARP LABORATORIES OF AMERICA, INC.

+1 more

Lab

AI components

2

ml · vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

12846766

Aspects of the present invention are related to systems, methods and apparatus for image-based automatic detection of a defective area in a flat panel display and classification of the defect type and the cause of the detected defect.

Machine learningVisionG01N 21/95G01N 21/8851G06T 7/0008G06T 7/001G01N 2021/8854G01N 2021/9513G06T 2207/30121

AI classification

Vision1.00
Machine learning0.91
AI hardware0.15
Evolutionary computation0.05
Planning0.01
Natural language0.01
Knowledge representation0.00
Speech0.00

Ownership

SHARP LABORATORIES OF AMERICA, INC.

assignment · 247630675

SHARP KABUSHIKI KAISHA

assignment · 357660324

Assignors

XU, XINYU, YUAN, CHANG, YANASE, MASAKAZU

On an employer assignment, the assignors are typically the inventors.

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